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[PVS] CFP- Special Issue on Dynamic Analysis and Testing of EmbeddedSoftware (DATES)




In response to author requests, we have decided to extend the deadline
of the Special Issue on Dynamic Analysis and Testing of Embedded
Software (DATES) to May 1, 2010.  We attach a revised call for papers
for your reference, and look forward to your submission.
 

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                           Call for Papers
 
                   Journal of Systems and Software
 
                           Special Issue on
      Dynamic Analysis and Testing of Embedded Software (DATES)
 

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Background
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Dynamic analysis and testing techniques of embedded software use the
information collected from executions to assure or evaluate software
artifacts, or to extract, infer, measure, or verify properties of
these artifacts.  At the same time, the stringent resource constraints
imposed by the hardware environment should also be addressed.
Although existing techniques for embedded software have been
investigated for decades, as new low-power devices emerge (such as
motes of wireless sensor networks, specialized devices for pervasive
computing, or wearable devices), many of them have serious limitations
to be directly applied to assure software running on these devices.
To detect failures from such software effectively and efficiently,
existing techniques should be re-examined or new techniques should
be developed.  This special issue solicits novel research results in
dynamic analysis and testing for embedded software that come with
theoretical and/or extensive empirical validation of the claimed
contributions.
 

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Topics
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The topics of interest include, but are not limited to:
 
*  Emerging dynamic analysis and testing techniques that can be
   applied on low-power platforms
 
*  Reports on successful experiences or limitations of techniques for
   analyzing and testing embedded software
 
*  Novel metrics, test adequacy, or correctness criteria for embedded
   software considering the low-power constraint
 
*  Efficient framework or automation to support analysis and testing
   of embedded software
 
*  Empirical evaluations or industrial case studies that direct future
   research directions
 

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Submission Information
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We welcome high quality submissions that are original work, not
published or currently submitted elsewhere.  We also encourage
extensions to conference papers, unless prohibited by copyright,
if there is at least 30% difference in the technical content.
Authors should follow the instructions posted at
http://www.elsevier.com/wps/find/journaldescription.cws_home/505732/authorinstructions
to prepare their manuscripts, which must be written in English and
submitted in PDF format via the Elsevier Editorial System (EES)
at http://ees.elsevier.com/jss.  To ensure the manuscripts
are correctly submitted to this special issue, please select
"Dynamic Analysis/Testing Embedded S/W" as the Article Type.
 

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Important Dates
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*  May 1, 2010         Paper submission deadline
*  August 1, 2010      All reviews back
*  August 15, 2010     First round notification
*  October 15, 2010    Revised submission deadline
*  December 15, 2010   All reviews back
*  January 15, 2011    Final notification
 

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JSS Editor-in-Chief
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*  Hans van Vliet
   Department of Information Management and Software Engineering
   Vrije Universiteit
   The Netherlands
 

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Guest Editors
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*  W. Eric Wong
   Department of Computer Science
   University of Texas at Dallas
   Email: ewong@utdallas.edu
   URL: http://www.utdallas.edu/~ewong
 
*  W.K. Chan
   Department of Computer Science
   City University of Hong Kong
   Email: wkchan@cs.cityu.edu.hk
   Home: http://www.cs.cityu.edu.hk/~wkchan
 
*  T.H. Tse
   Department of Computer Science
   The University of Hong Kong
   Email: thtse@cs.hku.hk
   URL: http://www.hku.hk/thtse
 
*  Fei-Ching Kuo
   Faculty of Information & Communication Technologies
   Swinburne University of Technology
   Email: dkuo@ict.swin.edu.au
   URL: http://www.ict.swin.edu.au/ictstaff/dkuo