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[PVS] CFP T4CIA 2010 (deadline extended)

           Testing Technologies and Tools for
             Critical Industry Applications
       2nd Workshop in conjunction with SSIRI 2010


The large amount of applications in industrial sectors (e.g. telecom,
medical, and energy) has many mission critical issues (e.g. security,
reliability). The competence of industry applications to ensure the
critical missions determines the competitive strengths in the
market. On one hand, industrial companies have introduced and
developed testing technologies and tools in industrial contexts, and
applied them in these applications. On the other hand, academic
researchers have produced and performed theoretical or experimental
research for the similar topics. This workshop aims to increase
scientific interaction and cooperation between academic researchers
and industrial practitioners in the area of critical industry
applications. It provides an excellent platform for the exchange of
ideas, discussion, cross-fertilization, inspiration, and
co-operation. Both researchers and practitioners will present their
results and experience to a broader audience.

Scope of the Workshop
The topics of interest include, but are not limited to:
· Methods, techniques and tools to support testing
· Different aspects of testing including functional, performance,
  security, etc.
· System specification and validation
· Application of model checking in testing
· Model based testing
· Testing processes in industry
· Theoretical foundations in testing
· Case studies and experience reports on critical industrial

Important Dates
February 20, 2010: Submission deadline (extended)
March 10, 2010: Notification date
April 1, 2010: Camera-ready and author registration due
June 10, 2010 (tentative): Workshop (half day)

Submission, Workshop Proceedings, Paper Presentation
Submit original papers (not published or submitted elsewhere) with a
maximum of 10 pages. Include the title of the paper, the name and
affiliation of each author, a 150-word abstract, and up to 8
keywords. The format of your submission must follow the IEEE
conference proceedings format.

Please submit your paper at
http://paris.utdallas.edu/ssiri10/start/www/T4CIA/. Or visit the
conference website http://paris.utdallas.edu/ssiri10, click on "Paper
Submission" in the left menu, and select "Submit papers to Testing
Technologies and Tools for Critical Industry Applications (T4CIA'10)"

Accepted submissions will be published by IEEE Press and available in
the IEEE digital library. One of the authors needs to register and
present the accepted submission. Each paper has 30 minutes, with 20-25
minute presentation.

Bao Tang (bao.tang@siemens.com)
Siemens IT Solutions and Services, China

Jun Pang (jun.pang@uni.lu)
University of Luxembourg, Luxembourg

Please do not hesitate to contact us by email if you have any question
or remarks.

Program Committee
Baptiste Alcalde, University of Luxembourg, Luxembourg
Jens R. Calamé, Hamburg, Germany
Benjamin Collar, Siemens, USA
Qing Gu, Nanjing University, China
Jun Pang (co-chair), University of Luxembourg, Luxembourg
Hongyang Qu, Oxford University, United Kingdom
Mariëlle Stoelinga, University of Twente, Netherlands
Rajesh Subramanyan, Siemens Corporate Research, USA
Jun Sun, National University of Singapore, Singapore
Bao Tang (co-chair), Siemens IT Solutions and Services, China
Kerry Zhu, WebEx, China