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[PVS] Deadline Extension: MBT 2009, Fifth Workshop on Model-Based Testing at ETAPS 2009

MBT 2009

Fifth Workshop on Model-Based Testing

*** EXTENDED DEADLINE: December 22, 2008 ***

March 22, 2009, York, UK 

Satellite workshop of ETAPS 2009

Final Call For Papers and DEADLINE EXTENSION

The workshop is devoted to model-based testing of both software and
hardware.  Model-based testing is closely related to model-based
specification.  Models are used to describe the behavior of the system
under consideration and to guide such efforts as test selection and
test results evaluation.  Both testing and verification are used to
validate models against the requirements and check that the
implementation conforms to the specification model.

Model-based testing has gained attention with the popularization of
models in software/hardware design and development. Of particular
importance are formal models with precise semantics, such as
state-based formalisms. Testing with such models allows one to measure
the degree of the product's conformance with the model.

Techniques to support model-based testing are drawn from diverse
areas, like formal verification, model checking, control and data flow
analysis, grammar analysis, and Markov decision processes.

The intent of this workshop is to bring together researchers and users
of models for to discuss the state of the art in theory, applications,
tools, and industrialization of model-based specification, testing and


MBT 2009 is the fifth event in a series of ETAPS satellite workshops.
MBT 2004, historically the first meeting to focus on model-based
testing, was held March 27-28, 2004, in Barcelona, Spain. MBT 2006 was
held in Vienna, Austria, MBT 2007 in Braga, Portugal, and MBT 2008 in
Budapest, Hungary. The proceedings have appeared in ENTCS (volumes 111,
164, 190, 220).


Original submissions are solicited from industry and academia. They
are invited to present their work, plans, and views related to
model-based testing. The topics of interest include but are not
limited to:

* Online and offline test sequence generation methods and tools
* Test data selection methods and tools
* Runtime verification
* Model-based test coverage metrics
* Automatic domain/partition analysis
* Combination of verification and testing
* Models as test oracles
* Scenario based test generation
* Meta programming support for testing
* Formalisms suitable for model-based specification and testing
* Application of model checking techniques in model-based testing
* Game-theoretic approaches to testing
* Model-based testing in industry: problems and achievements


Paper submissions: December 22, 2008 (extended deadline)
Notification of acceptance: January 14, 2009
Final versions: January 30, 2009


Research papers should be limited to 15 pages in ENTCS format,
describing significant research results based on sound theory or
experimental assessment.

We also solicit industry experience papers, about the use of
model-based testing in industrial environments. Such papers should be
limited to 15 pages, too.

Paper submission is now open at

Workshop proceedings will be distributed by the organizers of 
ETAPS'09. It is intended also that selected contributions will be
published in a journal.




Patrice Godefroid
Microsoft Research

Darko Marinov
University of Illinois at Urbana-Champaign


Bernhard K. Aichernig (Graz University of Technology, Austria)
Jonathan Bowen (Museophile Limited, UK)
Mirko Conrad (The MathWorks GmbH, Germany)
John Derrick (University of Kent, UK)
Bernd Finkbeiner (Universitaet des Saarlandes, Germany)
Marie-Claude Gaudel (Universite Paris-Sud, France)
Susanne Graf (Verimag, Grenoble, France)
Yuri Gurevich (Microsoft Research, USA)
Ziyad Hanna (Jasper Design Automation, USA)
Antti Huima (Conformiq Software Ltd., Finland)
Alexander S. Kossatchev (ISP RAS, Russia)
Darko Marinov (University of Illinois, USA)
Bruno Marre (Universite Paris-Sud, France)
Alexander K. Petrenko (ISP RAS, Russia)
Alexandre Petrenko (Computer Research Institute of Montreal, Canada)
Natasha Sharygina (University of Lugano, Switzerland)
Nikolai Tillmann (Microsoft Research, USA)
Jan Tretmans (Embedded Systems Institute, Eindhoven, The Netherlands)
Nina Yevtushenko (Tomsk State University, Russia)