CALL FOR PARTICIPATION
3rd International Design and Test Workshop
December 20-22, 2008
This event provides a unique forum to discuss novel approaches in design, automation and test in the Middle East and Africa (MEA) region for researchers and practitioners in the areas of VLSI design, test and fault tolerance to come together to discuss new research ideas and present new research results. This event will provide the only VLSI Design & Test-specific meeting in the MEA region. Workshop topics include all aspect of design, test and automation.
The IDT'08 conference will be held at the 'El Habib' **** hotel in the city of Monastir , Tunisia . For details, please see the conference web page.
The technical program is available at the conference web page. It
includes 3 invited keynotes, 52 regular papers,
10 short papers, 5 special sessions and 1 panel.
Mohamed Abid: CES-ENIS, BP. W, 3038, Sfax , Tunisia
Yervant Zorian: Virage Logic 47100, Bayside Parkway Fremont CA , 94538 , USA
Sponsored by: IEEE
In cooperation with: Mentor Graphics, ST-Microelectronics and Telnet
Partners: Computer Embedded Systems Laboratory